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          第三代
          半導體測試家族
          Third generation semiconductor testing family
           
        
        
          首頁 產品中心 Test System Power Device Testing System
          分類
          
    
           
           
     
    
            
    
           
          
        
            
        
           
             
        
                         
               
        
                
                
                
        
          
    
          
      
     
    
    
           
            
            
          
                  
          
                       
                       
            
                          
                                             
                       
     
                          
                          
                       
          
           
                 
          
                 
          
           
                
                   

          
    
          
             
                     
                        
          
                            
          
                                
          
                                    
          
                                    
                                                        
                                                    
                      
                                 
                
                
                
                
                                        
                                                   
                                    
          
                                    
          
                                    
          
                                    
          
                                
          
                            
          
                            
          
                                                        
                            
                            
                            
           
                        
          
             
          
             
          
                    
          
                             
          QT-3107 LCR RG/CG test
          
                             
          Self-developed LCR digital bridge supports Mosfet RG/CG testing and can also be used to test the capacitance of diodes with a resolution of 1fF.
          
                             
           


          

          

          
	
		
          
			
				
          
					 
				
          
				
          
					Support double DIE
				
          
			          		
			
				
          
					 
				
          
				
          
					High precision and anti-interference
				
          
			          		
			
				
          
					 
				
          
				
          
					Fast testing
				
          
			          		
			
				
          
					 
				
          
				
          
					Extended 2KV bias
				
          
			          		
		
          
	          

          
                             
          
                             
          
                                                          
          
                    
          
             
          
    
            
    
          
    

          
	
		
          
			
				Model 
			
			
				QT-3107
			
		
          
		
          
			
				Product Advantages 
			
			
				Using digital bridge, it has strong anti-interference ability and high test accuracy;
          
    The test time is 2-3 times faster than the analog bridge;
          
    Bias voltage up to 2KV;
          
			          		
		
          
		
          
			
				Key Features 
			
			
				Test resolution 1fF;
          
Self-equipped with ±100V bias source;
          
    Test frequency: 1MHz, extended to 2MHz;
          
    Output amplitude: 0.025-2V;
          
			          		
		
          
	          

          

          
                        
          
                        
          
                       
          

   
    
               
  

          Testing standards檢測標準
                
  
                
                
    
          
    
    
    
    
    
    
          
        
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