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          第三代
          半導(dǎo)體測(cè)試家族
          Third generation semiconductor testing family
           
        
        
          首頁(yè) 產(chǎn)品中心 Test System Power Device Testing System
          分類(lèi)
          
    
           
           
     
    
            
    
           
          
        
            
        
           
             
        
                         
               
        
                
                
                
        
          
    
          
      
     
    
    
           
            
            
          
                  
          
                       
                       
            
                          
                                             
                       
     
                          
                          
                       
          
           
                 
          
                 
          
           
                
                   

          
    
          
             
                     
                        
          
                            
          
                                
          
                                    
          
                                    
                                                        
                                                    
                      
                                 
                
                
                
                
                                        
                                                   
                                    
          
                                    
          
                                    
          
                                    
          
                                
          
                            
          
                            
          
                                                        
                            
                            
                            
           
                        
          
             
          
             
          
                    
          
                             
          QT-3104 QG gate charge test
          
                             
          QT-3104 QG meets the tiny QG value test of SiC devices.
          
                             
           


          

          

          
	
		
          
			
				
          
					 
				
          
				
          
					Support double DIE
				
          
			          		
			
				
          
					 
				
          
				
          
					Overload and undervoltage protection
				
          
			          		
			
				
          
					 
				
          
				
          
					High precision testing
				
          
			          		
			
				
          
					 
				
          
				
          
					Support extension
				
          
			          		
		
          
	          

          
                             
          
                             
          
                                                          
          
                    
          
             
          
    
            
    
          
    

          
	
		
          
			
				Model 
			
			
				QT-3104 QG
			
		
          
		
          
			
				Product Advantages 
			
			
				Meets the tiny QG value test of SiC devices
			
		
          
		
          
			
				Key Features 
			
			
				? Test capability: 200A/150V 150A/1000V
			
		
          
	          

          

          
                             
          
                             
          
                            
          

   
    
               
  
                
                
    
          
    
    
    
    
    
    
          
        
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