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          第三代
          半導體測試家族
          Third generation semiconductor testing family
           
        
        
          首頁 產(chǎn)品中心 Test System Power Device Testing System
          分類
          
    
           
           
     
    
            
    
           
          
        
            
        
           
             
        
                         
               
        
                
                
                
        
          
    
          
      
     
    
    
           
            
            
          
                  
          
                       
                       
            
                          
                                             
                       
     
                          
                          
                       
          
           
                 
          
                 
          
           
                
                   

          
    
          
             
                     
                        
          
                            
          
                                
          
                                    
          
                                    
                                                        
                                                    
                      
                                 
                
                
                
                
                                        
                                                   
                                    
          
                                    
          
                                    
          
                                    
          
                                
          
                            
          
                            
          
                                                        
                            
                            
                            
           
                        
          
             
          
             
          
                    
          
                             
          QT-3102 thermal resistance tester
          
                             
          QT-3102-XX test device type: triode, field effect tube, IGBT, diode
          
                             
           


          

          

          
	
		
          
			
				
          
					 
				
          
				
          
					Support double DIE
				
          
			          		
			
				
          
					 
				
          
				
          
					1000W thermal resistance
				
          
			          		
			
				
          
					 
				
          
				
          
					Overload and undervoltage protection
				
          
			          		
			
				
          
					
          
				
          
				
          
					
          
				
          
			          		
		
          
	          

          
                             
          
                             
          
                                                          
          
                    
          
             
          
    
            
    
          
    

          
	
		
          
			
				Type 
			
			
				QT-3102
			
		
          
		
          
			
				Advantages 
			
			
				QT-3102-XX test device type: triode, field effect tube, IGBT, diode
          
               R26: Can be built into the DC test item of QT-4100 to achieve high-power built-in thermal resistance testing
          
               R26：Dual Die testing can be implemented through scanbox
          
			          		
		
          
		
          
			
				Main Features 
			
			
				? The maximum current and maximum voltage depend on the model. The maximum current is 20A and 50A respectively.
          
                ? The maximum voltages are 100V and 200V respectively
          
			          		
		
          
	          

          

          
                           
          
                           
          
                          
          

   

              
               
  

          Testing standards檢測標準
                
  
                
                
    
          
    
    
    
    
    
    
          
        
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