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          QT-8400 power device multi-site test system
          Explore the infinite possibilities of third-generation transistors

          test host

          GaN Test Kit

          Power Device Test Kit

          QT-8400 is composed of test host and test station Test Kit,
          There are two types of Test Kit: Power Device Test Kit & GaN Test Kit.

          Test Kit
          Can be selected according to needs
          • Power Device Test Kit

            Power Device Test Kit for CP testing needs such as MOSFET/SIC, diodes, transistors, etc.

          • GaN Test Kit

            GaN Test Kit for Gallium Nitride testing needs.

          105cm
          Standing keyboard height
          75cm
          Sitting keyboard height
          Sign design
          Stand & sit
          quick switch
          Heart-touching
          user experience

          Based on the ergonomic design, the 8400 main case is designed for different environments such as design companies, laboratories, and packaging and testing factories to meet the user's keyboard operation needs in different standing and sitting postures. We have designed a unique guide line. , allowing users to quickly find the recommended keyboard height when standing or sitting, and can also fine-tune it according to personal height differences, which greatly improves operating comfort and efficiency.

          * Patent applied

          Sign design
          Stand & sit
          quick switch
          Heart-touching
          User experience

          Based on the ergonomic design, the 8400 main case is designed for different environments such as design companies, laboratories, and packaging and testing factories to meet the user's keyboard operation needs in different standing and sitting postures. We have designed a unique guide line. , allowing users to quickly find the recommended keyboard height when standing or sitting, and can also fine-tune it according to personal height differences, which greatly improves operating comfort and efficiency.

          * Patent applied

          105cm
          Standing keyboard height
          75cm
          Sitting keyboard height
          Parallel testing
          doubles efficiency
          Supports 2/4/8/16 Site parallel testing to meet customer needs for higher testing efficiency.
          Testing needs,
          comprehensive coverage
          QT-8400 platform provides 20A/100A, 1KV/2KV multi-site test solutions, support extended high voltage/DC modules, up to 8KV, 2000A, support extended avalanche, RGCG, dynamic RDson and other dynamic parameter test modules, to meet the third generation of semiconductor testing needs

          QT-8400 GaN

          QT-8400 D

          Test Range

          Dedicated to testing dynamic and static electrical parameters of gallium nitride

          Test Range

          Dedicated to MOSFET/SIC, diodes, transistors, IGBT and other CP testing.

          Parameter index

          Floating V/I Source
          Voltage 1KV/2KV
          20A/100A;

          Parameter index

          Floating V/I Source
          Voltage 1KV/2KV/3KV
          20A/100A/200A

          Number of parallel tests

          2/4/8/16 Site

          Number of parallel tests

          2/4/8/16 Site

          Extensible dynamic modules

          LCR test module (CG)
          Dynamic RDSON module (supports hard and soft cutting)

          Extensible dynamic modules

          Avalanche test module (UIS, EAS)
          LCR test module (RG, CG)

          Expandable high voltage/DC module

          Expandable up to 8KV, 2KA

          Expandable high voltage/DC module

          Expandable up to 8KV, 2KA

          Precise measurement

          The GaN Test Kit has a built-in precision measurement circuit to achieve accurate measurements at the nA level and mΩ level.

          Precise measurement

          The Power Device Test Kit has a built-in precision measurement circuit to achieve nA-level and mΩ-level accurate measurements.

          Flexible allocation
          of board resources
          Our equipment adopts a pluggable board architecture, allowing you to flexibly match boards according to your needs, thereby achieving precise control of testing costs.
          Comprehensive functions to
          meet various needs
          The test host boards are all four-quadrant V/I sources, equipped with AWG and oscilloscope, and have comprehensive functions to meet various scanning test needs such as I-V curves.

          Built-in oscilloscope graph

          AWG Editor
          PTS OS is intuitive and easy to use,
          Designed for testing & production
          We have fully optimized the QT-8400 PTS OS software interface to improve practicality, aesthetics and ease of use. Greatly improve the efficiency of test development, production and debugging and calibration, making it easy for users to operate efficiently.

          * Patent applied

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